Electronic Resource
Chester
:
International Union of Crystallography (IUCr)
Journal of synchrotron radiation
2 (1995), S. 99-105
ISSN:
1600-5775
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
Surface-sensitive X-ray absorption fine structure (XAFS) with sub-monolayer sensitivity based on grazing-incidence fluorescence detection is reported. The efficiency of fluorescence detection increased by more than two orders of magnitude by combining a multipole wiggler with a multi-element Si(Li) solid-state detector. The capability of the present technique for structural studies of surfaces and buried interfaces in the hard X-ray region was demonstrated by As K-edge XAFS studies of the InP(001) surface exposed to AsH3 flow. The results indicated that 0̃.1 monolayer As atoms are incorporated into the surface replacing the P atoms.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0909049595001506
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