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  • 1
    Electronic Resource
    Electronic Resource
    Oxford, UK : Blackwell Publishing Ltd
    Annals of the New York Academy of Sciences 394 (1982), S. 0 
    ISSN: 1749-6632
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Natural Sciences in General
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1432-0428
    Keywords: Insulin antibody ; insulin treatment ; insulin immunogenicity ; immunoglobulins ; Type 2 diabetes
    Source: Springer Online Journal Archives 1860-2000
    Topics: Medicine
    Notes: Summary The disappearance rate of insulin antibodies was studied after cessation of insulin treatment which had been given for 3 months to 6 years in 42 Type 2 (non-insulin-dependent) diabetic patients. Insulin antibodies were measured before and 15 days after interruption of insulin treatment, and every 30 days until the disappearance of insulin antibodies. The mean ± SD value of insulin binding in the entire group before the interruption of insulin treatment was 32±14%. There was no relationship between the antibody level at that time and the duration of insulin treatment. However, the insulin antibody level was significantly higher in 17 diabetic patients on an insulin dose of 〉20 U/day (p〈0.02) than in 25 on an insulin dose of 〈20 U/day (39±13% versus 28±12%). A positive correlation was found between intial insulin binding and the time required for it to fall below 10% (r = 0.74). Antibodies were absent 60 days after discontinuing insulin treatment in eight of ten subjects presenting with initial binding of 〈20%. In contrast, in only two of 12 patients with an initial binding of 〉40% were insulin antibodies detectable 150 days after discontinuation of insulin therapy. Disappearance of insulin antibodies sometimes took up to 1 year and occasionally even more than 2 years.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Springer
    Journal of sol gel science and technology 8 (1997), S. 249-253 
    ISSN: 1573-4846
    Keywords: porous materials ; TiO2 films ; titanium isopropoxide ; sol-gel method
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract The gels which are precursors of TiO2 porous materials are prepared by the controlled hydrolysis-condensation of titanium isopropoxide by polymeric method. In the present work, a study of the influence of different experimental conditions (water/alkoxide ratio, solvent/alkoxide ratio and temperature) on the structure and texture of the polymeric gels obtained with the same type of alkoxide has been investigated. The structural and textural modifications for the unsupported materials have been detected using DTA/TGA, XRD, specific surface area and pore size computerized measurements. The optical properties of the supported materials deposited on silicon wafers have been investigated using ellipsometric method. Supported and unsupported porous materials with different structure and texture have been obtained depending on different experimental and thermal treatment conditions.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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  • 4
    Electronic Resource
    Electronic Resource
    Springer
    Journal of sol gel science and technology 8 (1997), S. 249-253 
    ISSN: 1573-4846
    Keywords: porous materials ; TiO2 films ; titanium isopropoxide ; sol-gel method
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract The gels which are precursors of TiO2 porous materials are prepared by the controlled hydrolysis-condensation of titanium isopropoxide by polymeric method. In the present work, a study of the influence of different experimental conditions (water/alkoxide ratio, solvent/alkoxide ratio and temperature) on the structure and texture of the polymeric gels obtained with the same type of alkoxide has been investigated. The structural and textural modifications for the unsupported materials have been detected using DTA/TGA, XRD, specific surface area and pore size computerized measurements. The optical properties of the supported materials deposited on silicon wafers have been investigated using ellipsometric method. Supported and unsupported porous materials with different structure and texture have been obtained depending on different experimental and thermal treatment conditions.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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