ISSN:
1013-9826
Source:
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
(001)-, (1110), and (105)- oriented SrBi4Ti4O15 films with its c-axis tilted 0, 45 and 55o fromthe surface normal were epitaxially grown by metal organic chemical vapor deposition and the temperaturedependency of the dielectric constant was systematically investigated. Relative dielectric constant, εr,and its temperature dependency increased when the tilting angle of the c-axis from the substrate surfacenormal increased. Temperature dependency of εr was positive in case of the (105) and (1110) orientation,which is in good agreement with the conventional ferroelectric materials. On the other hand, it becamenegative for (001) orientation. This shows the orientation dependency of εr in SrBi4Ti4O15
Type of Medium:
Electronic Resource
URL:
http://www.tib-hannover.de/fulltexts/2011/0528/01/56/transtech_doi~10.4028%252Fwww.scientific.net%252FKEM.368-372.1811.pdf
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