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  • 1
    Electronic Resource
    Electronic Resource
    Simple retrofittable long-range x–y translation system for scanned probe microscopes (1996)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 3599-3604 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A simple, reliable system for long-range translation of scanned probe microscopy (SPM) samples is described. This system could easily be retrofitted to many existing SPMs. The sample is held magnetically onto the scan piezo tube, and is translated by stick-slip motion. The system is very reliable, and provides controllable step size ranging from 20 nm to 1 μm. Three stick-slip drive wave forms are described and tested: sawtooth, cycloid, and an "improved'' cycloid based on the resonance curve of a harmonic oscillator. Computer simulations of the stick-slip process are presented, and are in good agreement with experiment. Together, the experiments and simulations demonstrate that it is essential to consider the resonant response of the piezo when evaluating drive wave forms. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1147065
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    High bias transport and magnetometer design in open quantum dots (1998)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 72 (1998), S. 471-473 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report transport measurements as a function of bias in open semiconductor quantum dots. These measurements are well described by an effective electron temperature derived from Joule heating at the point contacts and cooling by Wiedemann-Franz out-diffusion of thermal electrons. Using this model, we propose and analyze a quantum dot based sensor capable of measuring absolute magnetic field at micron scales with a noise floor of ∼110 nT/Hz at 300 mK. Non optimized measurements reported here are ∼2 orders of magnitude above this floor. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.120789
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  • 3
    Electronic Resource
    Electronic Resource
    Patterning of sub-50 nm dense features with space-invariant 157 nm interference lithography (2000)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 77 (2000), S. 3149-3151 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have implemented a space-invariant interference lithography tool for 157 nm F2 lasers, capable of creating dense line and space patterns with a spatial period of 91 nm. No gratings or curved optics are required, allowing a simple and inexpensive tool for resist and process development at 157 nm. Initial patterning of several commercial and experimental resists has resulted in high contrast features with little line edge roughness and good cross-sectional profiles, indicating that the fundamental performance of acid-catalyzed resists patterned at 157 nm may meet lithography requirements for sub-50 nm features. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1326490
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    Paper (German National Licenses)
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