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  • 1
    Electronic Resource
    Electronic Resource
    Characterization of a microfocused circularly polarized x-ray probe (2000)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 2386-2390 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We report on the development of a circularly polarized x-ray microprobe in the intermediate energy range from 5 to 10 keV. In this experiment linearly polarized synchrotron radiation was circularly polarized by means of a Bragg-diffracting diamond phase retarder and subsequently focused down to a spot size of about 4×2 μm2 by a Fresnel zone plate. The properties of the microprobe were characterized, and the technique was applied to the two-dimensional mapping of magnetic domains in HoFe2. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1150625
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  • 2
    Electronic Resource
    Electronic Resource
    A high energy phase retarder for the simultaneous production of right- and left-handed circularly polarized x rays (1998)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 69 (1998), S. 1970-1973 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We have fabricated and characterized the performance of a monolithic Ge Bragg–Laue phase retarder capable of simultaneously producing both right- and left-handed circularly polarized x rays. The energy range of operation of the phase retarder is between 50 and 100 keV making it well suited to the measurement of spin-dependent Compton profiles within the impulse approximation, primarily because of the increased momentum resolution and larger Compton scattering cross section available at these higher incident energies. Although the phase retarder was optimized for operation at 86 keV, it can produce highly circularly polarized x rays over a substantial energy range. The performance of the phase retarder was tested via magnetic Compton scattering measurements on an Fe sample at the undulator A of the Advanced Photon Source. It was found to perform well in terms of flux and degree of circular polarization thereby greatly reducing the data collection times required for this inherently weak scattering process. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1148882
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  • 3
    Electronic Resource
    Electronic Resource
    A system for single-crystal elastic and inelastic x-ray scattering studies of condensed gases at pressures to 300 MPa and temperatures to 4 K : The 9th National conference on synchrotron radiation instrumentation (1996)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 3365-3365 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A versatile system, operating at pressures to 300 MPa and temperatures to 4 K, has been designed and used for a variety of elastic and inelastic x-ray scattering studies of single crystals of condensed gases. Sintered Be sample cells of volumes 15–30 mm3 are used. Pressure generation is clean and well controlled. Excellent temperature control allows monitoring of phase transitions associated with solidification and melting. The system has very low background and, combined with the high-intensity of synchrotron radiation, is well suited to studies of low-intensity signals. It has been used for 4He in q-dependent studies of fcc lattice dynamics and diffuse scattering and to study thermal defect properties through lattice parameter measurements. In addition, its application to inelastic scattering studies of hcp 4He at 1.5 eV and 10 meV resolution have yielded results about electronic and phonon excitations, respectively. The system can also be used to study other crystalline compounds; in particular, an application has been made to lattice parameter measurements on C2F6. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1147358
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  • 4
    Electronic Resource
    Electronic Resource
    X-ray Reflectivity at the L Edges of Gd (1997)
    Chester : International Union of Crystallography (IUCr)
    Journal of synchrotron radiation 4 (1997), S. 175-179 
    Details
    ISSN: 1600-5775
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Preparations are underway for the experimental investigation of the roughness of magnetic interfaces in rare-earth multilayers by combining the grazing-angle X-ray scattering technique with the resonant magnetic scattering of hard X-rays. Theoretical considerations show that for small scattering angles, 2θ, the asymmetry ratio, A = [I(+) − I(−)]/[I(+) + I(−)], depends on 2θ and varies as 1/cos θ. The first step towards the goal of determining the magnetic roughness has been taken by measuring the chemical roughness (via specular reflectivity) of a Gd thin-film sample at five photon energies close to the L3 absorption edge, which yielded the dispersion corrections, f′ and f′′, to the Gd atomic form factor in good agreement with the calculation of Cromer & Liberman [J. Chem. Phys. (1970), 53, 1891–1898].
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0909049597001441
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