Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
69 (1991), S. 7330-7332
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We present a general theory that describes the operation of scanning force microscopy in the contact force regime. We find that force derivatives along the surface of a sample produce images that can be dramatically enhanced relative to those of surface topography. For scanning tunneling microscopy atomic force microscopy (STM/AFM) and AFM configurations, the spring constant of the cantilever and the force derivatives perpendicular to the surface of the sample determine the enhancement, respectively.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.347586
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