ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
Photostimulated exoelectron microscope (PSEM) for observing mechanically damaged surfaces has been developed, which enables one to observe a photostimulated exoelectron (PSE) image in an EXO mode and the corresponding secondary electron image of the same region in a SEM mode, without reassembling an electron optical system. Typical results obtained with this microscope are presented.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1138448
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