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Low temperature scanning-tip microwave near-field microscopy of YBa2Cu3O7−x films (1997)

Takeuchi, I. ; Wei, T. ; Duewer, Fred ; [et al.]

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 71 (1997), S. 2026-2028

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ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: We have explored the low temperature capability of a scanning-tip microwave near-field microscope to study superconductors. The shift in the quality factor of the microscope resonator can be used to obtain the temperature dependence of the surface resistance of a local region under the tip. Patterned YBa2Cu3O7−x films were scanned at various temperatures and surface resistance mapping was performed with high spatial resolution at 1.2 GHz. Superconducting transitions at different positions on a film can be detected. Edge-region defects in wet-etched patterns were observed and were shown to be nonsuperconducting at microwave frequencies at 80 K. © 1997 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.119776

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