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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 72 (1992), S. 4705-4709 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Ceramic nickel-copper-manganite based negative temperature coefficient thermistors are unstable under thermal constraint, which increases the resistivity of these devices. This unstability can be reduced by the addition of a small amount of barium. These ceramics have a spinel structure, and the conduction takes place by a hopping process involving [Mn3+]/[Mn4+] octahedral ions. This study by the use of thermopower measurements points out that the resistivity change under thermal constraint is principally due to the disproportionation of [Mn3+]/[Mn4+] ions in the octahedral sites. Furthermore, it seems that some nickel ions migrate from octahedral to tetrahedral sites.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 57 (1985), S. 5535-5538 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This paper presents the changes of electrical characteristics in zinc oxide varistors subjected to hydrostatic pressure up to 4 kbar. Electrical measurements have been carried out with pressurized samples. Beyond 1 kbar, the leakage current increases exponentially with pressure as described by the relationship IF=P7,4. This leads to a decrease, by a factor of 2, of the nonlinear coefficient. In spite of choosing a different experimental approach and different material compounds, our results are in very good agreement with those already published.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 57 (1985), S. 4805-4807 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The dielectric strength of low-density polyethylene is measured under high hydrostatic pressure (25–800 bars) at temperature of 20, 45, and 70 °C. First results show that the breakdown field Eb decreases at 20 °C and increases with pressure in the range 45–70 °C for short-time tests. The significant variations of Eb are noted for 70 °C; for example, Eb=3.2 and 4.48 MV/cm for P=25 and 300 bars, respectively.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 2497-2501 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: On the basis of experimental results for the electrical breakdown field Fb in polyethylene terephthalate films, investigated previously under high hydrostatic pressure, P, from 50 to 500 bar at temperatures, T, of 35, 70, and 100 °C, the electromechanical and thermal breakdown models were used to explain variations in Fb. It was found by numerical calculations that the thermal breakdown model agreed better qualitatively and quantitatively with the negative temperature dependence and the positive pressure dependence of Fb than did the electromechanical model. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 81 (1997), S. 2363-2369 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The electrical breakdown of low density polyethylene films 100 μm thick was investigated experimentally and theoretically under high hydrostatic pressure (1 to 500 bar) at temperatures of 20, 70, and 90 °C. The theoretical analysis was based on combining the two basic mechanisms of thermal and electronic breakdowns by introducing a new parameter, pressure. This model mainly takes into account the transient current using the hopping transport phenomenon and local electric field distortion due to the presence of space charges in the material. The results of simulation show good agreement with experiments compared to our previous works on the modeling of electrical breakdown in which the effect of space charges was neglected. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 8218-8220 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Measurements of dc dielectric breakdown strength were made on polyethylene terephthalate films of 50 μm in thickness at temperatures of 35, 70, and 100 °C under hydrostatic pressure ranging from 50 to 500 bar. It has been found that the electrical breakdown field Eb increases with pressure and decreases with temperature. It is suggested that thermal breakdown is the dominant process. © 1994 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 61 (1987), S. 1562-1567 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The experimental part of this work describes a new method to determine the electrical characteristics of a single ZnO varistor grain-to-grain junction. The experimental results are described in statistical terms because each single barrier has been found to present its own electrical characteristics. There are "good'' and "bad'' barriers. On the basis of our experimental observations, we present an original approach to describing the current-voltage characteristics of ZnO varistors from the characteristics of individual junctions (series or parallel models). Finally, this work demonstrates that a ZnO sample having a low thickness and a large nonlinear coefficient value requires only "good'' junctions.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    New York : Wiley-Blackwell
    Die Makromolekulare Chemie 177 (1976), S. 1583-1596 
    ISSN: 0025-116X
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Physics
    Description / Table of Contents: Notre but est d'effectuer une corrélation entre les relaxations diélectriques du polyéthyléne et sa structure. Grâce à la technique des thermocourants de dépolarisation (TCD), nous avons montré l'existence d'und structure fine pour les modes de relaxation α, β, γ. Les processus «élémentaires» ont été isolés expérimentalement; ils sont bien décrits dans l'shypothése de relaxations thermiquement activées. Les résultats déduits de l'analyse de spectres de TCD résolus permettent de calculer la constante diélectrique complexe en fonction de la température et de la fréquence. Les courbes calculées perte d'énergie en fonction de température sont en bon accord avec les mesures effectuées au pont de mesure de capacités sur les mêmes échantillons, dans la gamme de fréquence accessible aux mainpulations.
    Notes: Our aim is to correlate dielectric relaxation with structure of polyethylene. By using the depolarization thermocurrent (DTC) technique it is shown that the so-called α-, β-, γ-relaxation modes have a fine structure. The “elementray” processes have been isolated experimentally; they are well described by the assumption of thermally activated relaxations. The data deduced from the analysis of the resolved DTC spectra allow to calculate the complex dielectric constant versus temperature and frequency. The calculated dielectric loss curves versus temperature are found in good agreement with bridge experiments performed on the same samples, in the available frequency range.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Journal of Applied Polymer Science 20 (1976), S. 1611-1618 
    ISSN: 0021-8995
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: A method of making thin polymer (polystyrene and polysiloxane) films by glow discharge is described. The thickness of the films varies between several hundred angstroms and a few microns. The parameters of the method are studied: pressure, frequency, current density in the discharge and discharge time. An interpretation of the physical phenomena is given, and we show that it applies qualitatively to the two polymers studied. An infrared spectrometric analysis of the product obtained shows that it differs little from the product obtained by chemical means and that, for polysiloxane, the most probable configuration is that of a linear polymer. Thermostability is studied, and we show that the polymer does not suffer any serious damage up to temperatures of 400°C applied for about 10 hr. The possibility of obtaining films of several thousand angstroms and with adequate temperature stability make it possible to use polymers in the insulation and the passivation of semiconductor components.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Journal of Applied Polymer Science 24 (1979), S. 503-510 
    ISSN: 0021-8995
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: The thin films of polystyrene obtained in an electrical discharge present a value of tan δ higher than that of traditional polystyrene films. It appears that oxygen is one of the factors bringing on this failure. A noticeable improvement of loss factor can be obtained either by addition of antioxydant or by reducing the electrodes spacing.
    Additional Material: 9 Ill.
    Type of Medium: Electronic Resource
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