Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
60 (1986), S. 3182-3187
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
dc photoconductivity characteristics of HgI2 single crystals have been measured in the range of 1.75–2.75 eV, using CuI as a transparent electrical contact. Hole and electron photocurrents could be separately measured by applying different voltage polarities to the illuminated electrode. It is shown that charge carrier generation near the surface is highly extrinsic, as displayed by differences in the hole and electron photogeneration spectra. Analysis of the photoconductivity versus voltage characteristics indicates that the hole and electron bulk trapping times satisfy τp 〉70 μs and τn 〉3 μs, respectively. The hole and electron surface recombination velocities were sp =1.0×104 cm/s and sn =8×105 cm/s, respectively.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.337733
Permalink
Library |
Location |
Call Number |
Volume/Issue/Year |
Availability |