ISSN:
1588-2780
Source:
Springer Online Journal Archives 1860-2000
Topics:
Chemistry and Pharmacology
,
Energy, Environment Protection, Nuclear Power Engineering
Notes:
Abstract Particle induced X-ray emission (PIXE) has been used for the quantitative analysis of rare earth elements (REE) in thick targets prepared from geological and mineral samples. Measurements were made with 1 and 3 MeV proton beams. For comparison, determination of the same elements was made by X-ray fluorescence (XRF) using a241Am annular source. Minimal detectable limits (MDL) have been estimated for the two situations. Neutron activation analysis (NAA) has also been used for the determination of REE at the ppm level.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF02037500
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