Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
57 (1985), S. 2550-2574
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
This paper describes the electrical design and evaluation of the Josephson cross-sectional model (CSM) experiment. The experiment served as a test vehicle to verify the operation at liquid-helium temperatures of Josephson circuits integrated in a package environment suitable for high-performance digital applications. The CSM consisted of four circuit chips assembled on two cards in a three-dimensional card-on-board package. The chips (package) were fabricated in a 2.5-μm (5-μm) minimum linewidth Pb-alloy technology. A hierarchy of solder and pluggable connectors was used to attach the parts together and to provide electrical interconnections between parts. A data path which simulated a jump control sequence and a cache access in each machine cycle was successfully operated with cycle times down to 3.7 ns. The CSM incorporated the key components of the logic, power, and package of a prototype Josephson signal processor and demonstrated the feasibility of making such a processor with a sub-4-ns cycle time.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.335444
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