Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
81 (1997), S. 1457-1463
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
The variation in the optical properties of metal-semiconductor composites (MSC) thin films due to particle-size distribution, metal volume fraction, film thickness, semiconductor dielectric constant, and microstructure are treated in a unified manner. These parameters are treated within the dynamic effective medium approximation which has been shown to accurately describe the optical properties of experimentally prepared MSC. The results of this treatment are successfully applied to Ag–Si composite systems. © 1997 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.364178
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