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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 60 (1989), S. 3482-3484 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: It is shown that care must be exercised in using digital equipment when making Hall measurements in a van der Pauw setup employing the ASTM standard method. This arises because of quantization error when working near the sensitivity limit of the equipment. For materials with small Hall mobilities (〈100 cm2/V s) this can lead to an incorrect specification of the carrier type and inconsistent mobility behavior. A simple averaging and sampling procedure is suggested to suppress this type of behavior and is found to be sufficient to obtain reliable and repeatable Hall voltages and coefficients.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 68 (1990), S. 2517-2519 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This communication provides a detailed examination of the morphology of thin films of CuInSe2 prepared by chemical spray pyrolysis on borosilicate glass, molybdenum-coated glass, and CdS substrates. The latter two are used in thin-film heterojunction solar cells of CuInSe2/CdS in the backwall and reverse backwall (RBW) configurations, respectively, and hence are of great technological interest. The pseudoepitaxial growth of CIS on CdS and its low deposition temperature (250 °C) which inhibits interdiffusion suggest that one should prepare CuInSe2/CdS solar cells in the RBW configuration.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 81 (1997), S. 1457-1463 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The variation in the optical properties of metal-semiconductor composites (MSC) thin films due to particle-size distribution, metal volume fraction, film thickness, semiconductor dielectric constant, and microstructure are treated in a unified manner. These parameters are treated within the dynamic effective medium approximation which has been shown to accurately describe the optical properties of experimentally prepared MSC. The results of this treatment are successfully applied to Ag–Si composite systems. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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