Electronic Resource
s.l. ; Stafa-Zurich, Switzerland
Journal of nano research
Vol. 3 (Oct. 2008), p. 45-58
ISSN:
1661-9897
Source:
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Topics:
Physics
Notes:
X-ray tools are being powerful methods for qualitative and quantitative analyses of nanocrystalline materials This work is an overview of detailed X-ray investigations relative to microstructural studies applied for a refined binary Al-based alloys thin films system as samples deposited on glass substrates. Energy dispersive analysis of X-ray (EDAX), X-ray diffraction (XRD) and transmission electron microscopy (TEM) methods were used to determine the chemical composition, the microstructure parameters and the solubility of copper in aluminum
Type of Medium:
Electronic Resource
URL:
http://www.tib-hannover.de/fulltexts/2011/0528/01/43/transtech_doi~10.4028%252Fwww.scientific.net%252FJNanoR.3.45.pdf
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