ZIB

Hits per page

hit 1 - 1 | 1 hit

Sorting

Electronic Resource

An integrated scanning tunneling, atomic force and lateral force microscope (1994)

Wenzler, L. A. ; Han, T. ; Bryner, R. S. ; [et al.]

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 65 (1994), S. 85-88

add to mindlist on the mindlist

Details

ISSN: 1089-7623

Source: AIP Digital Archive

Topics: Physics , Electrical Engineering, Measurement and Control Technology

Notes: We describe the design and operation of a combined scanning tunneling–atomic force–lateral force microscope [(STM), (AFM), (LFM)]. Including these capabilities in a single instrument reduces construction costs and increases flexibility. AFM and LFM may be performed simultaneously; a simple reconfiguration (requiring removing the AFM/LFM cantilever holder and replacing with a STM tip) changes the instrument into a STM. We present atomic forces depicted in force-to-distance curves and experimental imaging applications with all three techniques.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1144752

Permalink

Library	Location	Call Number	Volume/Issue/Year	Availability

Others were also interested in ...

Paper (German National Licenses)

Fulltext

hit 1 - 1 | 1 hit