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  • 1
    Electronic Resource
    Electronic Resource
    Thermally induced disorder in organized organic monolayers on solid substrates (1986)
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 90 (1986), S. 3054-3056 
    Details
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/j100405a004
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Atomic scale friction of a diamond tip on diamond (100) and (111) surfaces (1993)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 163-167 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The friction of a clean diamond tip on diamond (111) and (100) surfaces is studied using an ultrahigh vacuum force microscope that simultaneously measures forces parallel and perpendicular to the surface. The 30 nm radius diamond tip is fabricated by chemical vapor deposition. The attractive normal force curve between the tip and surface agrees well with calculated dispersion interactions. The frictional force exhibits periodic features, which on the (100) surface are tentatively associated with a 2×1 reconstructed surface convoluted over an asymmetric tip shape. The (111) surface shows features that cannot be simply related to the surface structure. As the tip is scanned back and forth along a line, the same features are observed in each direction, but offset, suggesting the presence of a conservative force independent of the direction of motion as well as a nonconservative force. The friction is approximately (approximately-equal-to)3×10−9 N independent of loads up to 1×10−7 N.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.353878
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  • 3
    Electronic Resource
    Electronic Resource
    Rotational and state-resolved translational distributions of NO scattered from organized amphiphilic monolayers (1988)
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 88 (1988), S. 2757-2763 
    Details
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Two-photon ionization has been used to probe NO scattered from two different long chain organic amphiphiles. Rotational and state-resolved translational distributions were obtained. The results show that there is a large difference in the dynamics of scattering from an unsubstituted aliphatic chain as compared to a monolayer in which the exposed end has been perfluorinated. NO scattered from the latter is more energetic both rotationally, and translationally. This effect becomes particularly noticeable as the incident energy of the NO is raised. The results can be explained by a mechanism which ignores the weak NO–surface potential and treats only the differences in rigidity and phonon modes in the two monolayers.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.454006
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    Paper (German National Licenses)
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  • 4
    Electronic Resource
    Electronic Resource
    A micropipette force probe suitable for near-field scanning optical microscopy (1992)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 63 (1992), S. 4061-4065 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: In this paper it is demonstrated that glass micropipettes have unique applicability as force probes for a variety of imaging conditions and a variety of scanned tip microscopies. These probes are characterized in terms of the parameters that determine their force characteristics. Measurements are presented showing that one can readily achieve force constants of 10 N/m and it is anticipated that a reduction in this force constant by two orders of magnitude can be achieved. Such probes can be produced simply with a variety of geometries that permit a wide range of force imaging requirements to be met. Specifically, the glass micropipette probes reported in this paper are readily produced with apertures at the tip and can thus be applied to near-field scanning optical microscopy (NSOM). This opens the possibility of the long-awaited development of a universal feedback mechanism for NSOM.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1143212
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  • 5
    Electronic Resource
    Electronic Resource
    DIKETOCYCLOBUTENEDIOL (1959)
    s.l. : American Chemical Society
    Journal of the American Chemical Society 81 (1959), S. 3480-3480 
    Details
    ISSN: 1520-5126
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/ja01522a083
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  • 6
    Electronic Resource
    Electronic Resource
    Electronic effects of ion mobility in semiconductors: Mixed electronic–ionic behavior and device creation in Si:Li (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 80 (1996), S. 2749-2762 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Micrometer-sized homojunction structures can be formed by applying strong electric pulses, at ambient temperatures, to Li-doped, floating zone n-Si. Two such junctions, arranged back to back, act as a transistor, as evidenced by electron-beam-induced current and current–voltage measurements. The structures are created during a time ranging from ∼100 ms to a few seconds, depending on the size of the structure. The phenomenon is similar to what was observed earlier in CuInSe2 and was explained there by thermally assisted electromigration of Cu. In the case of Si doped with Li we can use secondary-ion-mass spectrometry to detect the redistribution of Li after electric-field application. Such a redistribution is indeed found and corresponds to an n+-p-n structure with the p region extending at least ∼20 μm into the bulk of Si. Structures created in Si doped with Li in this way are stable for at least 13 months after their creation. We ascribe this to the large difference between Li diffusivity at the local temperature that is reached during structure formation (∼400 °C; 10−8 cm2/s) and at room temperature (∼10−15 cm2/s). © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.363132
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  • 7
    Electronic Resource
    Electronic Resource
    Multifunctional, micropipette based force cantilevers for scanned probe microscopy (1994)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 65 (1994), S. 648-650 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We demonstrate quartz micropipette and optical fiber based structures with unique applications for scanned probe microscopy. These probes are produced by drawing, cantilevering, and polishing tapered micropipettes and optical fibers and have significantly greater potential functionality than any other currently available scanning tip. We present normal force, contact mode imaging of a selection of surfaces, operating these probes with different commercial instruments for atomic force microscopy (AFM). With their very sharp tips, ultrahigh aspect ratios, and readily adjustable force constants and resonance frequencies, the probes present an attractive alternative to conventional microfabricated cantilevers that are currently in routine use with AFM. Bent quartz optical fiber probes also enable simple integration of near-field scanning optical microscopy and AFM.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.112259
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  • 8
    Electronic Resource
    Electronic Resource
    Anisotropic nanoindentation of transcrystalline polypropylene by scanning force microscope using blade-like tips (1999)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 74 (1999), S. 2966-2968 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A scanning force microscope was fitted with an elongated, blade-like tip, with which nanoindentations were performed in the transcrystalline isotactic polypropylene phase grown from the surface of high-modulus carbon fibers. The anisotropic Young's modulus was evaluated by measuring the force–penetration curve of the indentation and the tip topography, as a function of the indentation depth. The modulus is 1.6–3 times higher when the longer axis of the indenting tip is perpendicular to the transcrystalline growth direction than when it is parallel to that direction. We discuss possible options for the lamellar arrangement in a transcrystalline isotactic polypropylene layer and, based on the present experimental data, propose a most likely model. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.123981
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  • 9
    Electronic Resource
    Electronic Resource
    Fabrication of sub-μm bipolar transistor structures by scanning probe microscopy (1998)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 73 (1998), S. 1868-1870 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We show how sub-μm sized transistor structures (down to 50 nm cross section) can be fabricated by thermally assisted electromigration of mobile dopants inside the semiconductor CuInSe2. Small device structures are fabricated by application of an electric field to the sample via the contact, defined by a conducting atomic force microscope tip. The structures are characterized by nm scale scanning spreading resistance and scanning capacitance measurements to reveal the inhomogeneous doping profiles created by the electric field. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.122309
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  • 10
    Electronic Resource
    Electronic Resource
    Force microscopy with a bidirectional capacitance sensor (1990)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 61 (1990), S. 2296-2308 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A new method for sensing cantilever deflection in the atomic force microscope (AFM), based on capacitance measurement, is described. Parameters governing the design of such an instrument are considered in detail. Two different geometries are compared, wire on plate and an integrated flat plate sensor. The electronic circuitry, providing 6×10−19 F noise in a 0.01–1000 Hz bandwidth, is also described. Implementation of the design ideas into a working AFM in ultrahigh vacuum is demonstrated. This AFM allows simultaneous measurement of cantilever deflection in two orthogonal directions, necessary for our nanotribology studies. The theoretical sensitivity of 5×10−7 F/m is not achieved due to roughness. The bidirectional sensing and imaging capabilities are demonstrated for an Ir tip on cleaved graphite, and a diamond tip on diamond films. The capacitance detection technique is compared and contrasted with other AFM sensors.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1141354
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