ISSN:
1573-482X
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract Time-dependent crystalline structure and surface morphology of transparent conducting thin films of undoped tin oxide have been studied under environmental conditions by X-ray diffractometry and scanning electron microscopy. Tin oxide thin films were produced, via chemical vapour deposition, in three batches; two batches with single deposition at substrate temperatures of 400
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00180780
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