ISSN:
1662-9752
Source:
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
In this work, growth stresses have been investigated in relation with the microstructure inthe case of α-Cr2O3 growing oxide films on NiCr30 alloy. The equibiaxial growth stresses have beenmeasured thanks to a technique coupling Raman spectroscopy and in situ high temperatureoxidation of the NiCr30 alloy in the temperature range [700°C-900°C]. The low acquisition timenecessary to obtain a Raman spectrum allows to follow the chromia growth kinetic with sufficientaccuracy. It is demonstrated that the growth stress in such oxide films can attain more than 2 GPa,before additional thermal stress arises on cooling. Moreover, the growth stress kinetic - subsequentestablishment and relaxation - are highly microstructure sensitive: in particular, as the oxidationtemperature rises, the chromia grain size also increases, and it consequently retards the occurrenceof the creep relaxation phenomena which needs an additional stress to start
Type of Medium:
Electronic Resource
URL:
http://www.tib-hannover.de/fulltexts/2011/0528/02/20/transtech_doi~10.4028%252Fwww.scientific.net%252FMSF.595-598.881.pdf
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