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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 2411-2414 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Real-time measurements of intrinsic stresses during growth of polycrystalline and epitaxial aluminum nitride (AlN) thin films on Si(111) are reported. Our room-temperature measurements on polycrystalline films corroborate previous post-growth measurements. Our high-temperature measurements provide evidence of large intrinsic stresses during epitaxial growth of AlN on Si(111) and insignificant stress relaxation during growth.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 57 (1990), S. 1185-1187 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Picosecond duration laser pulses are used to generate ultrashort acoustic pulses in a bilayer metal film. Time-resolved transient piezoreflectance measurements permit the observation of acoustic reflections from a metal-metal interface within the film, as well as reflections from the film-substrate interface. We show that our measurements are well described by an abrupt interface model of acoustic mismatch.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 55 (1989), S. 402-404 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report the results of phonon relaxation processes obtained from picosecond transient thermoreflectance measurements of single-crystal La2CuO4+y (y∼0.06). Nonequilibrium heating was found to occur on a picosecond time scale. The time scale of the nonequilibrium heating is a sensitive measurement of the modest electron-phonon interaction (λ≤0.1) in the nonsuperconducting La2CuO4+y.
    Type of Medium: Electronic Resource
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  • 4
    ISSN: 1432-0630
    Keywords: 07.65 ; 42.65 ; 42.80
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract The noise characteristic of available laser sources limits the sensitivity of many types of nonlinear spectroscopy. We show how to maximize the sensitivity by optimizing the strength of a local oscillator wave in a heterodyne detection scheme without altering the amplitude of the wave being detected. The intensity profile of the optimum local oscillator closely matches that of the incident probe wave, but the optimum intensity is much less than that of the probe under realistic conditions. A general signal-to-noise analysis applicable to all nonlinear spectroscopy techniques is presented along with specific applications to coherent Raman spectroscopy, two-photon absorption, saturation spectroscopy, and optical coherent transient techniques. A simple optimization procedure employing polarization selection rules is described. Detailed calculations are performed for the case of TEM00 waves interacting via a third-order nonlinear susceptibility and for the case where the sample is simultaneously probed at many different frequency combinations.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Springer
    International journal of thermophysics 11 (1990), S. 811-817 
    ISSN: 1572-9567
    Keywords: high-speed techniques ; reflectance ; sound velocity ; thermal diffusivity ; thin films
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract An optical transient reflectance technique has been developed to characterize both the thermal and the elastic properties of thin-film materials. The use of picosecond-duration laser pulses permits the study of metal films of the order of 100 nm thick. We demonstrate the measurement of thermal diffusivity and acoustic velocity, in addition to observations of the thermal impedance of a single metal-metal interface.
    Type of Medium: Electronic Resource
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