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  • 1
    Electronic Resource
    Electronic Resource
    Near-field scanning solid immersion microscope (1998)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 72 (1998), S. 2779-2781 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report a near-field scanning optical microscope using a solid immersion lens having a sharp tip that is mounted to a cantilever. The sharp tip allows the sample to enter the near field of the illumination. The cantilever provides sensitive control of forces. We describe two types of near-field optical contrast, interference and reflection, that simultaneously measure surface topography and reflectivity. Using a super-hemispherical lens with index n=2.2 and 442 nm illumination, the microscope resolves optical features smaller than 150 nm, a factor of 2 improvement over a conventional optical microscope. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.121457
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Energy dissipation in tapping-mode atomic force microscopy (1998)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 72 (1998), S. 2613-2615 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A method is presented to measure the energy dissipated by the tip–sample interaction in tapping-mode atomic force microscopy (AFM). The results show that if the amplitude of the cantilever is held constant, the sine of the phase angle of the driven vibration is then proportional to changes in the tip–sample energy dissipation. This means that images of the cantilever phase in tapping-mode AFM are closely related to maps of dissipation. The maximum dissipation observed for a 4 N/m cantilever with an initial amplitude of 25 nm tapping on a hard substrate at 74 kHz is about 0.3 pW. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.121434
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  • 3
    Electronic Resource
    Electronic Resource
    Field-dependence of microscopic probes in magnetic force microscopy (1996)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 69 (1996), S. 705-707 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present a technique for characterizing the magnetic state of a magnetic force microscopy (MFM) probe as a function of uniform external magnetic field H. A local magnetic field is generated by micron-scale current carrying conductors and directly imaged by MFM. As H alters the magnetic state of the probe, changes in image contrast yield componentwise measures of the tip's net magnetic moment m, tip hysteresis loops and coercivities, and possible orientations (vertical vs lateral) of remanent states mr used for most MFM imaging. Results are presented for a variety of thin-film probes. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.117813
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  • 4
    Electronic Resource
    Electronic Resource
    Near-field photolithography with a solid immersion lens (1999)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 74 (1999), S. 501-503 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have exposed 190 nm lines in photoresist by focusing a laser beam (λ=442 nm) in a solid immersion lens (SIL) that is mounted on a flexible cantilever and scanned by a modified commercial atomic force microscope. The scan rate was 1 cm/s, which is several orders of magnitude faster than typical reports of near-field lithography using tapered optical fibers. The enhanced speed is a result of the high optical efficiency (about 10−1) of the SIL. Once exposed with the SIL, the photoresist was developed and the pattern was transferred to the silicon substrate by plasma etching. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.123168
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  • 5
    Electronic Resource
    Electronic Resource
    Image enhancement of polyethersulfone ultrafiltration membrane surface structure for atomic force microscopy (1992)
    New York, NY [u.a.] : Wiley-Blackwell
    Journal of Applied Polymer Science 46 (1992), S. 167-178 
    Details
    ISSN: 0021-8995
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: The surface topography and pore structure of ultrafiltration membranes can be investigated with atomic force microscopy. In this study, it was found that the substitution of ethanol for water as the immersion medium improved the resolution of the fine structure of 10K polyethersulfone ultrafiltration membranes. Pores in the membrane surface from 7 to 9 nm in diameter were measured, which coincides with the range expected for 10,000 molecular weight cutoff (MWCO) ultrafiltration membranes. It is believed that this image enhancement results from increased damping and concomitant noise reduction resulting from the higher viscosity of ethanol in contrast to water.
    Additional Material: 8 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/app.1992.070460116
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