ISSN:
0887-6266
Schlagwort(e):
Polymethylmethacrylate
;
spin casting
;
density profiles
;
neutron reflectivity
;
reflectometry
;
Chemistry
;
Polymer and Materials Science
Quelle:
Wiley InterScience Backfile Collection 1832-2000
Thema:
Chemie und Pharmazie
,
Physik
Notizen:
The density profiles of polymethylmethacrylate (PMMA) thin films on silicon (111) single crystal wafers were investigated via neutron reflectivity measurements. Films were prepared by spin casting PMMA onto silicon wafers from o-xylene solution followed by annealing under vacuum at 90°C for 5 h. A ∼45 Å thick layer at the free polymer surface was observed in the as-prepared samples that has a density about half the value of bulk PMMA. After heating above 110°C, this diffuse layer disappeared and the thin film density profile was transformed to one with a sharp free polymer surface. This transition was found to be irreversible. © 1994 John Wiley & Sons, Inc.
Zusätzliches Material:
2 Ill.
Materialart:
Digitale Medien
URL:
http://dx.doi.org/10.1002/polb.1994.090321504
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