Electronic Resource
Copenhagen
:
International Union of Crystallography (IUCr)
Applied crystallography online
3 (1970), S. 110-112
ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
A method is suggested, using diffraction line displacements, to facilitate simultaneous determination of one-dimensional strain in a particular direction in the surface of a polycrystalline material and of the lattice parameter corresponding to the unstressed state. A single exposure at perpendicular incidence of the primary X-ray beam enables both values to be obtained. Full advantage is taken of the ratios of diffraction ring diameters.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0021889870005782
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