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  • 1
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 99 (1995), S. 16670-16675 
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 69 (1998), S. 2427-2438 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A new microcalorimeter for measuring heats of adsorption on clean single-crystal surfaces is described, and its operational characteristics are presented. The principle is similar to that pioneered by David King's group: A pulse of gas from a molecular beam adsorbs on an ultrathin single crystal's surface, causing a measurable transient heat input and temperature rise. Our novel heat detector is a 9 μm thick pyroelectric polymer ribbon, which is mechanically driven to make a gentle mechanical/thermal contact to the back of the single-crystal sample during measurements. Advantages include use of thicker samples (1 μm), sample preparation at very high temperatures, and potential measurements at cryogenic temperatures. A novel chopped molecular beam of metal vapor and a method of correcting for absorbed radiation from the hot effusion cell are also described. This system is applied to study the heats of adsorption of metals on clean, well-defined and single-crystalline surfaces as a detailed function of coverage, from which metal/substrate adhesion energies can also be extracted. We obtain pulse-to-pulse standard deviations of 〈2% in the heat of adsorption for pulses containing 〈0.03 ML of Cu and Pb, and absolute accuracy to within a few percent. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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