Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
75 (1994), S. 4055-4059
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Copper phthalocyanine-titanium oxide (CuPc-TiOx) heteromultilayers have been fabricated by evaporation and reactive evaporation techniques, and their structural and optoelectronic properties investigated. X-ray diffraction and secondary ion mass spectroscopy confirm the formation of a clear alternating layered structure on a nanometer scale. An interface roughness of 7 A(ring) has been achieved for a multilayer with an artificial period of 40 A(ring). Atomic force microscopy at scratched edges of the multilayers reveal double-layered structures of TiOx on CuPc, indicating the existence of two kinds of interface. Transverse photoconduction measurements on samples deposited on SnO2-coated glass, using a back electrode of Al, show the occurrence of electron transfer from CuPc to TiOx at the interfaces.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.356029
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