Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
63 (1988), S. 4929-4932
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
The polarity of cadmium telluride crystals has been determined by a novel electron diffraction technique. This technique employs an electron microscope in normal operating conditions, and is applicable to any noncentrosymmetric crystal, provided that the deviation from centrosymmetry is not too small. We have thus identified the best {111} face for epitaxy on CdTe as the (1¯1¯1¯)Te face. This is in agreement with recent x-ray results and Rutherford backscattering results. Chemical etching characteristics of {111} faces were used to compare our results with previous polarity determinations. One commonly used etch is found to be unreliable for polarity identification.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.340435
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