ISSN:
1013-9826
Source:
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
The chemical composition and the valence state of elements on the surface of ZrO2 thin filmsdeposited on glass substrates have been studied by X-ray photoelectron spectroscopy. Results show that:elements of Na, Mg, Zr, Ca exist in the form of their respective stable state, such as Na2O, MgO, ZrO2,CaO, when heat treated at 500°C for 0.5h; but Si is unstable, and exhibit stoichiometrical disturbances.Results of chemical composition and their content by atom percent of ZrO2 thin films surface reveal that:Si, and Ca diffuse from glass to the thin films in scale; Na diffuses few and Mg collects to the thin filmssurface. The diffusion of Mg2+ and Ca2+ from glass to ZrO2 thin films is negative diffusion
Type of Medium:
Electronic Resource
URL:
http://www.tib-hannover.de/fulltexts/2011/0528/01/56/transtech_doi~10.4028%252Fwww.scientific.net%252FKEM.368-372.1277.pdf
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