Electronic Resource
Springer
Contributions to mineralogy and petrology
127 (1997), S. 383-390
ISSN:
1432-0967
Source:
Springer Online Journal Archives 1860-2000
Topics:
Geosciences
Notes:
Abstract Diffusion rates for the three tetravalent cations U, Th and Hf have been measured in synthetic zircon. Diffusant sources included oxide powders and ground pre-synthesized silicates. Rutherford backscattering spectrometry (RBS) was used to measure depth profiles. Over the temperature range 1400–1650 °C, the following Arrhenius relations were obtained (diffusion coefficients in m2sec−1): log D Th = (1.936 ± 0.9820) + (− 792 ± 34 kJ mol−1 /2.303 RT) log D U = (0.212 ± 2.440) + (− 726 ± 83 kJ mol−1 /2.303 RT) log D Hf = (3.206 ± 1.592) + (− 812 ± 54 kJ mol−1 /2.303 RT) The data show a systematic increase in diffusivity with decreasing ionic radius (i.e., faster diffusion rates for Hf than for U or Th), a trend also observed in our earlier study of rare earth diffusion in zircon. Diffusive fractionation may be a factor in the Lu-Hf system given the much slower diffusion rates of tetravalent cations when compared with the trivalent rare earths. The very slow diffusion rates measured for these tetravalent cations suggest that they are essentially immobile under most geologic conditions, permitting the preservation of fine-scale chemical zoning and isotopic signatures of inherited cores.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/s004100050287
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