Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
65 (1994), S. 3407-3409
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We propose a just-on-surface magnetic force microscope (JS-MFM) for advanced spatial resolution of magnetic stray field image. In this letter, we describe that the JS-MFM provides better resolution of the stray field image than that in conventional magnetic force microscope, theoretically and experimentally. In the rough estimations, magnetic stray field image just on the surface provides higher resolution of less than 10 nm. In the experiments, initial results demonstrate that JS-MFM can observe a localized surface magnetic stray field caused by small magnetizations in the perpendicularly recorded magnetic domains with a high resolution of around 10 nm. © 1994 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.112987
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