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  • 1
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 79 (2001), S. 63-65 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Structural transformations of carbon nanoparticles are studied by means of molecular dynamics using a density-functional-based tight-binding method. The starting particles consist of 64 to 275 atoms arranged on a graphitic or diamond lattice. At elevated temperatures (1400 to 2800 K), the particles transform into spherical or elongated closed cages, concentric shell fullerenes, carbon nanotips, and spiraloidal and irregularly shaped clusters. The type of the final cluster depends essentially on the size and the atomic order of the starting particles, and on the temperature applied. The results show a way to proceed towards controlled preparation of specific carbon nanostructures. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 33 (2000), S. 1386-1392 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: An analytical expression for the small-angle neutron scattering intensity of diluted systems of polydisperse spherical particles, with diffusion zones, embedded in a matrix is presented. It is used within a nonlinear regression procedure to analyse small-angle neutron scattering experiments with polarized neutrons on an Fe73.5Si15.5B7CuNb3 alloy. The results for the nuclear and magnetic scattering length densities allow verification of the inhibitor concept introduced for the explanation of the limited sizes of precipitates developing during nanocrystallization. In the case of amorphous Fe73.5Si15.5B7CuNb3 alloy, the observed nanocrystals of the Fe3Si type are surrounded by an Nb-enriched shell, which stops the growth of the precipitates. With the results of polarized neutron scattering experiments, it is shown that magnetic and nuclear small-angle neutron scattering signals have the same origin. Additionally, the precision of the fits is improved by complementary use of polarized neutrons.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 34 (2001), S. 666-668 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Bulk amorphous Zr54.5Ti7.5Al10Cu20Ni8 was investigated by means of small-angle neutron scattering and high-resolution electron microscopy. Partially crystallized states were generated by annealing. The scattering data were analyzed in terms of a model taking into account both properties of the particles and interparticle interference. The mean radius of the particles is 1.3 nm. They are surrounded by a depletion zone with mean thickness of 2.6 nm. The volume fraction of the particles is estimated from the interparticle interference effect; its upper limit after annealing at 653 K for 4 h is 12%. Electron microscopy confirms the size determined from the scattering data and shows that the particles are crystalline.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Springer
    The European physical journal 211 (1968), S. 313-316 
    ISSN: 1434-601X
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The tunnel-current in normal metals should show a fine structure due to the dynamical electron-phonon interaction and the momentum dependence of the tunneling matrix elements. This structure reflects the peaks of the density of phonon states and is smaller than that one observed in superconductors by one order of magnitude.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Springer
    Microchimica acta 125 (1997), S. 349-353 
    ISSN: 1436-5073
    Keywords: microstructure ; MoSx films ; X-ray diffraction ; TEM
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract The influence of process parameters on the formation of microstructure of magnetron-sputtered MoSx-films on silicon wafers was investigated. The MoSx-films were analyzed by means of X-ray diffraction and TEM. The prepared MoSx-films show a microstructure in dimension of some nm without any prefered orientation or texture. The X-ray diffraction measurements indicate clearly differences in the structure for various preparation conditions. Simulations provided a first structural model for the description of the MoSx-films. The MoSx-films consist of two-dimensional nanocrystals and noncrystallographic randomly packed (001) planes. Transitions between these structural states and intermediate states determine the microstructure depending on the preparation conditions.
    Type of Medium: Electronic Resource
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