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  • 1
    Electronic Resource
    Electronic Resource
    Electrostatic forces between metallic tip and semiconductor surfaces (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 77 (1995), S. 3308-3314 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Atomic force microscopy used in the resonant mode is a powerful tool for measuring local surface properties: for example, the quantitative analysis of the electrical forces induced by the application of an electric field between a conductive microscope tip and a surface allows the determination of the tip/surface capacitance and the local surface work function. However, these quantitative analyses require knowledge of tip geometry. In this article, we show that the simple procedure of evaluating the tip curvature radius by fitting the variations of the electrostatic force with the tip-surface distance is not always adapted to the case where one of the tip-surface system elements is a semiconductor. However, particular experimental conditions are determined to overcome these difficulties. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.358616
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    In situ measurement of large piezoelectric displacements in resonant atomic force microscopy (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 2848-2852 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: In resonant atomic force microscopy (AFMR) the calibration of the tip–sample relative displacement remains a major problem. Commonly used PZT piezoceramics exhibit a nonlinear behavior response for large applied voltages. For low voltages applied to the piezoceramics (i.e., small corrugations), the calibration can be performed by measuring the height of known structures. For large displacements, the interferometric heterodyne detection used in the AFMR provides a relative tip–sample displacement up to 10 μm, without removing the piezo-tube from the microscope. From these measurements, it was established that the piezosensitivity is not a constant parameter. Its averaged value during an excursion depends linearly on the applied voltage. With this system, routine controls are very easy and an example is given of the displacement corrections related to the nonlinearity of the piezo-tube for the electrostatic interaction between the tip and a gold surface. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145566
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  • 3
    Electronic Resource
    Electronic Resource
    Van der Waals and capacitive forces in atomic force microscopies (1999)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 86 (1999), S. 5245-5248 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: In this article we show that in the atomic force microscopy experiments performed on a metallic surface, there is always a long range electrostatic force in addition to the van der Waals forces. This capacitive force is due to the contact potential between the tip and the surface and exists even without external applied potential. We have calculated this capacitive force for a real geometry of the tip–sample system and compared it to the van der Waals force calculated for the same geometry. We conclude that the electrostatic force is always dominant for a tip–surface distance larger than half of the tip radius of curvature. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.371506
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  • 4
    Electronic Resource
    Electronic Resource
    Evaluation of the capacitive force between an atomic force microscopy tip and a metallic surface (1998)
    Springer
    The European physical journal 2 (1998), S. 5-10 
    Details
    ISSN: 1434-6036
    Keywords: PACS. 06.30.-k Measurements common to several branches of physics and astronomy - 07.50.-e Electrical and electronic components, instruments, and techniques - 41.20.-q Electric, magnetic, and electromagnetic fields
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract: We propose a very simple method to determine the electrical tip-surface force in Atomic Force Microscopes used to study the electrical properties of metallic or insulating materials; the analysis of the measurements as well as determination of the appropriate experimental procedures requiring an analytical model of the tip-surface capacitance. The comparison of force expressions obtained by this method with those obtained by exact derivation in the case of the sphere-infinite plane system shows very good agreement. This method is then applied to determine the tip-surface force, the real shape of the tip being introduced in the derivation. The obtained expression is compared to experimental and numerical data. We emphasize that this method is very general and can be applied to any axially symmetric capacitor.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/s100510050219
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  • 5
    Electronic Resource
    Electronic Resource
    Local triboelectricity on oxide surfaces (1999)
    Springer
    The European physical journal 12 (1999), S. 471-477 
    Details
    ISSN: 1434-6036
    Keywords: PACS. 73.20.-r Surface and interface electron states – 73.40.-c Electronic transport in interface structures – 73.90.+f Other topics in electronic structure and electrical properties of surfaces, interfaces, and thin films
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract: In triboelectric phenomena, electric charges are transferred when two materials are touched or rubbed together. We present in this paper a study of this effect performed on metallic oxides at the nanometric scale by an Atomic Force Microscope in the resonant mode. We show that following the electrification processes, positive or negative charges can be deposited. From our experimental data, we conclude that the charge transfer results in an equilibrium final state, the occupied states in the gap being “surface states” with large density and spread under the surface along a characteristic distance of about 100 nm.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/s100510051028
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