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  • 1
    Digitale Medien
    Digitale Medien
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 91 (2002), S. 1213-1218 
    ISSN: 1089-7550
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: The relation between electrical and structural properties of indium tin oxide (ITO) films prepared by pulsed laser deposition with and without in situ laser irradiation is examined. The residual stresses of the films were estimated from x-ray diffraction patterns measured by grazing-incidence asymmetric Bragg and grazing-incidence x-ray diffraction geometries. For the films prepared without in situ irradiation, the residual stress depended on oxygen pressure (PO2) during deposition and had minimum around PO2 of 1.3 Pa, which coincided with the optimum PO2 for growing the lowest resistivity films. The resistivity was only slightly improved with an increase of substrate temperature (Ts) because a large residual stress was introduced. In contrast, the ITO films prepared with in situ laser irradiation showed very low resistivity (ρ〈10−4 Ω cm) which can be attributed to the high crystallinity and low residual stress. © 2002 American Institute of Physics.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 2
    Digitale Medien
    Digitale Medien
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 74 (1999), S. 3059-3061 
    ISSN: 1077-3118
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: Low-resistivity (ρ) and highly transparent pure indium oxide (In2O3) thin films grown on glass substrates by pulsed laser deposition at substrate temperature (Ts) between room temperature and 200 °C are reported. As-deposited films with resistivity (ρ) of ∼3×10−4 Ω cm and transmittance (visible), above 87% were obtained within a narrow range of PO2 (1×10−2–1.5×10−2 Torr). Hall effect measurements showed that the low ρ resulted from the high carrier concentration (n)∼7×1020 cm−3, whereas modest Hall mobility (μ〈45 cm2 V−1 s−1) was measured. X-ray diffraction indicated that the films prepared at Ts≤100 °C were amorphous, while at Ts≥150 °C polycrystalline films were obtained. © 1999 American Institute of Physics.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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