ISSN:
1551-2916
Source:
Blackwell Publishing Journal Backfiles 1879-2005
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
Nanomorphologies and crystallographic orientations of the brazed interface of silicon nitride (Si3N4) were analyzed via high-resolution transmission electron microscopy. When Si3N4 was brazed using an Ag-Cu-Ti alloy, titanium nitride (TiN) nanoparticles were formed adjacent to the ceramic as reaction products, and these nanoparticles were commonly accompanied by C-phase material. The structure of Si3N4/TiN interface was wavy on an atomic scale, which was considered to provide anchoring points that offered high mechanical strength. The TiN nanoparticles extended along the [0001] axis of Si3N4. The orientation relationship between TiN and ß-Si3N4 was, as determined from the observed lattice images, that the [110] direction of TiN was parallel to the [0001] direction of Si3N4. The nature of the crystallographic relationships and interface nanomorphologies were also discussed.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1111/j.1151-2916.1998.tb02342.x
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