ISSN:
0142-2421
Keywords:
Chemistry
;
Polymer and Materials Science
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
It is shown that the accuracy by which a concentration-depth profile can be estimated from the inelastic background of an XPS spectrum is dramatically improved by using two-dimensional (2D) data. The energy loss distribution of the photoelectrons for several values of the detection angle, or the energy of the excitation source, are treated as a single 2D data set. The resolution of the depth profile estimated from this set is far better than can be obtained from any single XPS spectrum.
Additional Material:
4 Ill.
Type of Medium:
Electronic Resource
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