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  • 1
    Electronic Resource
    Electronic Resource
    Charge exchange recombination spectroscopy measurements of ion temperature and plasma rotation in PBX (1985)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 56 (1985), S. 865-867 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The primary diagnostic on PBX for ion temperature measurements is charge exchange recombination spectroscopy of low Z ions, wherein fast neutrals from the heating neutral beams excite spectral lines from highly excited states (n〉4) of hydrogenic O, C, and He via charge exchange collisions with the respective fully stripped ions. Since the neutral beams on PBX provide relatively low-velocity neutrals (i.e., D° beams at 44 keV), best signals are obtained using the near-UV lines of O7+ (e.g., n=8–7, 2976 A(ring)). Off-line analysis of the Doppler broadened and shifted line profiles includes nonlinear least-squares fitting to a model line profile, while a simplified on-line fast analysis code permits between-shot data analysis.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1138075
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Utilization of charge exchange recombination spectroscopy for the study of metallic ion transport in TFTR (1988)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 59 (1988), S. 1518-1520 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Charge exchange recombination spectroscopy has been used to observe transitions originating from hydrogen-, helium-, and lithiumlike charge states of medium-Z metallic impurities in TFTR. The temporal and spatial densities of these ions were measured in ohmic and neutral beam heated plasmas. These preliminary results agree with predictions of a transport code.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1140182
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Corrections to charge exchange spectroscopic measurements in TFTR due to energy-dependent excitation rates (1988)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 59 (1988), S. 1521-1523 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The use of charge exchange spectroscopy to determine plasma rotation speeds and ion temperature is complicated by the energy dependence of the excitation cross sections. The Doppler-broadened spectral line shape is distorted by the relative velocity between the neutral hydrogen atoms of the injected beam and impurity ions. The asymmetric nature of the energy dependence of this cross section causes a nonmotional shift of the line center and a nonthermal change in the linewidth. These effects vary with the angles between the beam direction, rotation velocity direction, and direction of the viewing sightline. When viewing two neutral beams at different angles on TFTR, the two measurements of vφ(r) show discrepancies of about 20%–30% with each other. The calculation of the spectral intensity profiles using the available excitation rates overcorrects these discrepancies and indicates the need for better excitation coefficients.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1140183
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    Paper (German National Licenses)
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  • 4
    Electronic Resource
    Electronic Resource
    Soft-x-ray camera for internal shape and current-density measurements on a noncircular tokamak (1988)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 59 (1988), S. 1831-1833 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A two-dimensional, tangentially viewing, soft-x-ray pinhole camera has been fabricated to provide internal shape measurements on the PBX-M tokamak. It consists of a scintillator at the focal plane of a foil-filtered pinhole camera, which is, in turn, fiber-optically coupled to an intensified framing video camera (Δt≥3 ms). Automated data acquisition is performed on a stand-alone image processing system, and data archiving and retrieval take place on an optical disk video recorder. The derivation of the poloidal emission distribution from the measured image is done by fitting to model profiles.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1140074
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    Paper (German National Licenses)
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  • 5
    Electronic Resource
    Electronic Resource
    SPRED spectrograph upgrade: High-resolution grating and improved absolute calibrations (1986)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 57 (1986), S. 2043-2045 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Two improvements to the SPRED multichannel VUV spectrographs used on the TFTR and PBX tokamaks have been made: (1) a new 2100-g/mm grating covering the 100–320-A(ring) region with 0.4-A(ring) resolution (FWHM) has been added to the existing 450-g/mm grating (100–1100 A(ring) with 2-A(ring) resolution), and (2) the TFTR SPRED has been absolutely calibrated using synchrotron radiation from the NBS SURF II facility, while the PBX system has been calibrated using conventional branching ratios along with line ratios from charge-exchange-recombination excited lines. The availability of high-resolution spectra in the 100–320-A(ring) range provides improved measurements of metallic ion emissions and, when the instrument views across a neutral beam as in PBX, allows carbon and oxygen densities to be measured via charge-exchange-recombination spectroscopy.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1138784
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    Paper (German National Licenses)
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