Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
60 (1986), S. 2754-2761
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Estimating uncontrolled thermal gradients between a system thermometer and a sample mounted in some measurement cell is a problem recognized in many experimental situations. To demonstrate a solution we describe a computer based low-frequency ac method for determining the relevant thermal impedances in a high-resolution capacitance dilatometer/oven system. Heat generated sinusoidally in time from a Peltier element allows measurements of complex transfer functions relating the response of thermometers placed at different locations. In particular, letting thermal expansion of a mounted sample represent its temperature has permitted a precise frequency analysis of the thermal separation from the primary system thermometer. The results characterizing the apparatus are compared to simple models for heat transport where the frequency response is described in terms of a relaxation time or an effective thermal diffusivity. The method is adaptable to a wide variety of measurement cells.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.337106
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