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Observation of ballistic carrier propagation in Bi and W by scanning electron microscopy (1999)

Knauth, S. ; Lenzner, J. ; Herrnberger, H. ; [et al.]

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 85 (1999), S. 276-279

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ISSN: 1089-7550

Source: AIP Digital Archive

Topics: Physics

Notes: A scanning electron microscope with cryogenic sample holder has been employed for spatially resolved excitation of carriers. A point contact at a fixed position on the sample surface opposing the area scanned by the electron beam serves as a local current probe. Ballistic propagation and focusing of electron beam excited carriers is observed in single crystalline high purity samples of bismuth and tungsten over distances of typically 100 μm. Signal contributions from diffusive carrier flow as well as ballistic phonons are observed in addition to the ballistic electron signals. © 1999 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.369441

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