ISSN:
1662-9752
Source:
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
We carried out cross-sectional transmission electron microscopy (TEM) investigation offemtosecond laser-induced ripples formed on 4H-SiC single crystal surface. Here, we paid attentionto the crystal structures underlying the coarse and fine ripples and the three-dimensional distributionof amorphous phase. Conventional and high-resolution TEM analyses made clear that a continuousamorphous layer approximately of 50 nm thick exist at the topmost region of both coarse and fineripples. The result strongly suggests that the fundamental surface deformation process is common forcoarse and fine ripples, even though the factors which determine their periods are different
Type of Medium:
Electronic Resource
URL:
http://www.tib-hannover.de/fulltexts/2011/0528/02/20/transtech_doi~10.4028%252Fwww.scientific.net%252FMSF.600-603.883.pdf
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