ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A very compact active x-ray mirror based on the properties of bimorph piezoelectric systems has been developed at the ESRF. The use of such a system as an x-ray focusing device has a number of advantages among which are compactness, low cost, and versatility. As a demonstrative test, a white focused beam of 35 μm has been obtained on an ESRF bending magnet beamline that corresponds to a demagnification of 1/18. A theoretical description of the system behavior is given, and compared with both finite element analysis and interferometric measurements. Examples of more advanced devices are discussed. © 1995 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1145715
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