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  • 1
    ISSN: 1090-6487
    Keywords: 61.12.Ld ; 61.12Bt
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The dynamical Laue diffraction has been studied for a direct beam diffracted from a thin (∼3.5 cm) α-quartz crystal at the Bragg angles close to 90°. It is shown that diffraction occurs at Bragg angles up to 87°. The time-of-flight method is used to measure the time of the neutron presence in the crystal under the diffraction conditions. The time delay for a scattered neutron inside the crystal predicted earlier for the Bragg angles close to 90° confirmed experimentally. The effective velocity of the neutron propagation in a crystal measured at the incident-neutron velocity of 810 m/s and the diffraction angle of 87° equals (43±1) m/s. The result obtained confirms the possibility of increasing, by an order of magnitude, the sensitivity of the diffraction method of determining the dipole moment of a neutron at Bragg angles close to 90° predicted earlier theoretically.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1090-6487
    Keywords: 14.20.Dh ; 13.40.Em ; 61.12.Ex
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The depolarization of a neutron beam executing Laue diffraction in a thick (∼3.5 cm) noncentrosymmetric α-quartz crystal is observed. This effect was predicted by us earlier and suggested for measuring the electric dipole moment (EDM) of a neutron. The effect is due to an interaction of the magnetic moment of a moving neutron with a strong crystal electric field, as a result of which the neutron spin rotates in opposite directions for waves of two types excited in the crystal. The effect is studied for neutron diffraction by a system of crystallographic (110) planes at Bragg angles close to π/2, up to 87°. It is shown that, for a crystal of thickness L=3.5 cm, a direct beam initially polarized along the reciprocal lattice vector becomes depolarized upon diffraction, irrespective of the value of Bragg angle, whereas the beam polarized perpendicular to the diffraction plane retains its polarization. The Eτ value determining the sensitivity of the method to EDM is experimentally estimated.
    Type of Medium: Electronic Resource
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