Digitale Medien
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
67 (1995), S. 188-190
ISSN:
1077-3118
Quelle:
AIP Digital Archive
Thema:
Physik
Notizen:
The photorefractive effect in materials such as bismuth silicon oxide (BSO) depends on photoionizing deep defect levels inadvertently present rather than controllably introduced. Using thermal stimulated conductivity measurements, a preliminary attempt has been made at associating specific levels with a particular sillenite member and impurity dopants. While many of the features prevail throughout, significant changes occur when Ge is substituted for Si to give BGO and when p- (Al) and n-type (P) impurities are added to dope BSO.
Materialart:
Digitale Medien
URL:
http://dx.doi.org/10.1063/1.114662
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