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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Il nuovo cimento della Società Italiana di Fisica 18 (1996), S. 621-633 
    ISSN: 0392-6737
    Keywords: Conductivity phenomena in semiconductors and insulators ; General theories and computational techniques (including many-body perturbation theory, density-functional theory, atomic sphere approximation methods, Fourier decomposition methods, etc.)
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Summary A calculation method for the scattering cross-section σ of charged carriers on radiation-induced cluster defects has been developed using a spherical cluster model with rectangular potential barrier shape, of radius and height of 15 nm and 0.6 eV, respectively. Values of the cluster cross-section around 2·10−11 cm2 have been obtained for charged carrier energies from 10−4 eV to over 600 eV. Applying the relaxation-time approximation of the Boltzmann equation, the influence of clusters on silicon transport properties has been observed to be close to the acoustic-phonon one. The dependence of the Hall factor on radiation-induced clusters has been determined numerically for temperatures ranging from 5 K to 400 K. The results indicate that the presence of clusters of such dimensions would not change significantly the Hall coefficientR H.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 76 (2000), S. 3067-3069 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Trapping levels in fresh (one month) and naturally aged (one year) nanocrystalline porous silicon have been investigated using the optical charging spectroscopy method. Four significant maxima and/or shoulders were observed for fresh samples and five for aged ones. They have been attributed to five and six trapping levels, respectively. The trapping centers corresponding to the most shallow four levels are situated at or nearby the internal surface of the porous silicon films. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Nuclear Instruments and Methods in Physics Research Section A: 345 (1994), S. 303-307 
    ISSN: 0168-9002
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
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