Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
79 (2001), S. 4363-4365
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
A defect characterization method is presented, the time domain measurement of spin-dependent recombination (TSR). Recombination between paramagnetic states is changed rapidly by electron spin resonant excitation through strong nanosecond microwave pulses. After the pulse, a slow relaxation of the recombination rate towards its steady state takes place. By measuring the current transient after the resonant pulse, information about dissociation and recombination probabilities of spin pairs is directly obtained for a distinct recombination path. Dangling bond recombination in microcrystalline silicon was used as model process for the demonstration of TSR. © 2001 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1428623
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