ISSN:
1662-9752
Source:
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
The alloying and phase formation in Ni-Hf samples with 0.2-, 2-, and 5-at.% Hf werestudied by X-ray diffraction (XRD) technique and scanning electron microscopy (SEM). Bothcharacterization methods, XRD and SEM, reveal the presence of the HfNi5 phase (fcc structure)where the excess Ni atoms are present in the form of Ni or Ni-rich segregations in the samplecontaining 5-at.% Hf. The sample with 2-at.% Hf is characterized by the presence of the two phasespresent in the 5-at.% sample and by Hf atoms, which occupy substitutional lattice positions in theNi lattice. Finally, in the third sample with 0.2-at.% Hf, the Hf atoms mainly substitute the Ni atomsin the lattice. This analysis is being complemented with additional information on the local structurearound Hf by extended X-ray absorption fine structure spectroscopy (EXAFS)
Type of Medium:
Electronic Resource
URL:
http://www.tib-hannover.de/fulltexts/2011/0528/02/13/transtech_doi~10.4028%252Fwww.scientific.net%252FMSF.518.325.pdf
Permalink