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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 3950-3957 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The deep acceptor levels associated with Au impurities have been investigated for single-crystal and polycrystalline silicon specimens with the use of electrical resistivity and Hall-coefficient measurements. The heat treatments related to possible grain-boundary segregation of Au impurities were performed for the polycrystalline specimens. Furthermore, in order to investigate the influence of lattice dislocations on the deep Au level, dislocation-free and dislocated single crystals were used and appropriate heat treatments were performed. It is shown that the activation energies for Au acceptor levels are strongly dependent on the presence of lattice imperfections such as grain boundaries and lattice dislocations in the Si crystal. A simple physical interpretation for these experimental findings is also given on the basis of tight-binding electronic theory.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 2965-2968 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The electrical transport properties of Au-doped p-type polycrystalline silicon have been investigated by using the electrical resistivity and Hall mobility measurements. It has been found that the specific resistivity increases with decreasing annealing temperature and Hall mobility decreases with decreasing the effective carrier (hole) concentration, in contrast to the normal result for the single-crystal specimen. A simple physical interpretation of these results is also given.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Superlattices and Microstructures 16 (1994), S. 359 
    ISSN: 0749-6036
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Physics Letters A 107 (1985), S. 185-189 
    ISSN: 0375-9601
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    s.l. ; Stafa-Zurich, Switzerland
    Solid state phenomena Vol. 138 (Mar. 2008), p. 209-240 
    ISSN: 1662-9779
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Physics
    Notes: The thermodynamic properties and phase transformations of metals and alloys are studiedusing the statistical moment method, going beyond the quasi-harmonic approximations. Includingthe power moments of the atomic displacements up to the fourth order, the Helmholtz free energiesand the related thermodynamic quantities are derived explicitly in closed analytic forms. Thethermodynamic quantities, like thermal lattice expansion coefficients, specific heats, Grüneisenconstants, elastic constants calculated by using the SMM are compared with those of othertheoretical schemes and the experimental results. The hcp-bcc structural phase transformationsobserved for IVB elements, Ti, Zr and Hf, are discussed in terms of the anharmonicity of thermallattice vibrations. The equilibrium phase diagrams are calculated for the refractory Ta-W and Mo-Tabcc alloys. In addition, the temperature dependence of the elastic moduli C11, C12 and C14 and thoseof the ideal tensile and shear strengths of the bcc elements Mo, Ta and W are studied: We alsodiscuss the melting transitions of metals and alloys within the framework of the SMM and estimatethe melting temperatures through the limiting temperature of the crystalline stability
    Type of Medium: Electronic Resource
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