Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
87 (2000), S. 6493-6495
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We demonstrate spatial resolution of ferromagnetic resonance in a microscopic sample of YIG using ferromagnetic resonance force microscopy (FMRFM). Measurements were performed on a small single crystal YIG film grown on a GGG substrate, roughly rectangular in shape 20 μm×∼150 μm and 3 μm thick. The perpendicular and parallel force geometries of FMRFM, in conjunction with an external bias field both parallel and perpendicular to the film, were used to scan the sample. This enabled the detection of strong signals, even at atmospheric pressure and room temperature. The fundamental and higher-order magnetostatic modes were observed to have 26–29 Gauss separation. The intensity of these modes exhibited spatial variation as the magnetic tip was scanned over the sample, and this behavior is qualitatively explained by DE theory. An improved fabrication method for magnet on cantilever was employed, which yielded a spatial resolution of 15 μm. These results demonstrate the potential of FMRFM for investigating the spatial dependence of ferromagnetic resonance, and for studying the anisotropy fields and exchange coupling effects within multilayer films and small magnetic systems. © 2000 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.372748
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