Library

feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The effect of 3.5 keV electron irradiation on adhesion and contact resistivity of the Ag/YBa2Cu3O7 interface has been studied using an evaporated silver layer on c-axis oriented superconducting YBa2Cu3O7 thin films. Electron doses ranged between 1016 and 1018 electrons/cm2. The Q-tip method of adhesion testing showed that even at the lowest electron dose adhesion is significantly improved. The contact resistivity of the interface was measured using a cross-junction four-point probe. Contact resistivity was unchanged at the lowest electron dose but increased as the electron dose increased. A theoretical model involving an electron irradiation damaged layer at the interface has been developed to explain measured contact resistivity changes. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 6858-6860 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Electron-stimulated desorption of positive and negative oxygen ions from YBa2Cu3O7 surfaces has been studied as a function of electron kinetic energy in the 70–600 eV range. It has been found that the threshold electron kinetic energy needed to induce positive oxygen ion desorption occurs at 260±5 eV, whereas that associated with negative oxygen ion desorption was found to be 100±5 eV. These electron kinetic energies correspond to Cu, Y, and Ba core-level binding energies. These results suggest that negative and positive oxygen ion desorption may be initiated via a primary core level ionization. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 3
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 32 (1999), S. 956-962 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Small-angle X-ray scattering (SAXS) is often used to study porous and aggregated fractal materials. Typically when q is small or when large primary-beam intensities are required, the small-angle geometry employed introduces infinite-slit-height smearing into the experimental data. Herein, simple derivations for infinite-slit-height-smeared SAXS from porous surface and mass fractals are presented, including an approximation for aggregated mass fractals. The models allow rapid analysis of background-subtracted data without the need for deconvolution. An equation is derived that allows analysis of normalization from deconvolution routines applied to porous-fractal data. This model is tested using simulated and experimental SAXS data.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...