ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
Small-angle X-ray scattering (SAXS) is often used to study porous and aggregated fractal materials. Typically when q is small or when large primary-beam intensities are required, the small-angle geometry employed introduces infinite-slit-height smearing into the experimental data. Herein, simple derivations for infinite-slit-height-smeared SAXS from porous surface and mass fractals are presented, including an approximation for aggregated mass fractals. The models allow rapid analysis of background-subtracted data without the need for deconvolution. An equation is derived that allows analysis of normalization from deconvolution routines applied to porous-fractal data. This model is tested using simulated and experimental SAXS data.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0021889899008559
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