ISSN:
1572-817X
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Physics
Notes:
Abstract This paper presents a theoretical and experimental study of the application of the near-field technique to the measurement of local radiance in small area semi-conductor sources. It is devoted to a description of the causes of broadening, and of the conditions needed to obtain the best near-field distribution. We examine the influence of the radius of the detector diaphragm, of the magnification used and of the modulation transfer function of the system.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00619376
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