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Optical characterization of low-energy electron-beam-colored LiF crystals by spectral transmittance measurements (1999)

Montecchi, M. ; Nichelatti, E.

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 86 (1999), S. 3745-3750

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ISSN: 1089-7550

Source: AIP Digital Archive

Topics: Physics

Notes: The complex refractive index of a LiF crystal surface layer irradiated by low-energy electrons is modified by the stable formation of color centers embedded in it. A simplified dipole-electromagnetic field interaction model has been adopted in order to estimate the dispersion curves of colored LiF from a single optical transmittance measurement. The excellent agreement with the corresponding experimental curves (obtained by means of spectrophotometry and ellipsometry) demonstrates this to be a promising approach for LiF-based optical waveguide characterization.© 1999 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.371245

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