ISSN:
1432-0630
Keywords:
73
;
79.40
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
Abstract The electron field emission from a metal covered with a thin layer of a semiconductor with electron affinity χ and dielectric constant ɛ is considered. The model takes into account the metal-semiconductor (Schottky) barrier of height ϕb, the conduction current inside the semiconductor, and the band bending at the semiconductor-vacuum interface due to the external field penetration. For thick films under moderately high electric fields, the metal-semiconductor interface does not influence the emission behaviour whereas for thin films, the interface plays an important role, depending on the barrier heights. In particular, for χ/ϕb〈ε2/3 the I–V characteristics will, for strong fields, be dominated by the field emission process at the interface. In such cases important deviations from Fowler-Nordheim behaviour are found.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00324502
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