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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 1057-1071 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A study of the electrical and optical properties of the Se deep donor states in AlxGa1−xAs:Se grown by metalorganic vapor phase epitaxy (MOVPE) process is reported. A novel experimental technique is presented to determine the absolute energy and the true density of the deep donor. The characteristics of the Se deep donor states are obtained from deep level transient spectroscopy, photoluminescence, photocapacitance, Hall effect measurements, isothermal capacitance transient measurements, and a quasistatic capacitance voltage technique. It is found that the Se dopant gives rise to at least two energy levels in the band gap. One is the generally observed deep donor level, commonly called the DX level and the other is a new shallower donor state which also exhibits DX-like properties. The concentration of the shallower state is less than 5% of the deep donor density. The densities of both donors increase with the mole fraction of H2Se used during MOVPE growth. Thermal emission activation energies of 0.29±0.01 and 0.24±0.01 eV were found for the deep and shallower donor states, respectively, for 0.23≤x≤0.41. The Se donor ionization energies relative to the Γ minimum are determined for samples with different AlAs mole fractions, and also, the true densities of Se donors are obtained. We propose a macroscopic model for the emission and capture mechanisms of Se donors in AlxGa1−xAs, which allows a consistent interpretation of the results obtained by different measurement techniques and provides a natural explanation for the low temperature Hall density saturation phenomenon and the persistent photoconductivity effect.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 115 (2001), S. 5582-5588 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Sum-frequency vibrational spectroscopy was used to study how linearly polarized UV irradiation could cause bond breaking and alter the surface structure of a polyimide. The spectroscopic results allowed the determination of an approximate orientational distribution of the polymer backbones at a rubbed surface. They also permitted deduction of rates of bond breaking of the backbones at the surface by UV dosage. The surface anisotropy resulting from bond breaking by linearly polarized UV irradiation was found to be relatively small, suggesting a weak azimuthal anchoring energy for liquid crystal films deposited on such a surface. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 72 (2001), S. 2735-2737 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A cryogenic stage preamplifier for the TopHat experiment is built with InterFet NJ132L junction field effect transistors. We describe the testing procedure, screening, and fabrication of the six-channel preamplifier. It is attached to the LN2 shield and self-heats to 110 K with 20 mW total dissipation. The noise performance with grounded input is 7 nV root-mean-square (rms)/Hz at 1.5 Hz and 1 nV rms/Hz at 50 Hz. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 56 (1990), S. 177-179 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report a new analysis technique to determine the acceptor density NA and the donor density ND in high-purity GaAs from 10 K photoluminescence (PL) measurements. For both n-type and p-type samples, we find that NA/ND is related to the excitonic intensity ratio rx=I(A0,X)/I(D0,X) by NA/ND=0.89rx−0.06. In addition, NA can be determined from NA=1014IA, where IA is the emission intensity of the donor-acceptor pair transition normalized to the intensity of the unresolved exciton peak. Therefore, for n-type and p-type material with an impurity density 1013–1016 cm−3, NA and ND can be determined solely from a 10 K PL measurement. The advantage of this technique lies in its nondestructive nature and its applicability to situations where Hall measurements are not possible or suitable.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 82 (1997), S. 528-535 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This article compares switching behaviors between negative (Nn) and positive (Np) dielectro-anisotropic nematic liquid crystals driven by an in-plane electric field which is generated with interdigital electrodes. Even for Np type liquid crystals, excellent viewing angle characteristics were obtained as expected. Theoretical descriptions of the switching principle, i.e., threshold behavior and response mechanism, could be applied to both the Nn and Np type liquid crystals. However, the orientational deformation of the Np type liquid crystals caused by a distorted electric field which occurred near the edges of electrodes was not the same as that of the Nn type liquid crystals. The switching of the Np type liquid crystals near the edges of the electrodes by this field was followed by the in-plane switching of the liquid crystals between the electrodes. This remarkably distinctive dynamical behavior implied a difference in the response of the longitudinal axes for Nn and Np type liquid crystal molecules. The longitudinal axes of the latter seemed to be sensitive to the electric field component perpendicular to the substrates when applying the in-plane electric field. Furthermore, these experimentally obtained results were supported by computer simulations which analyzed the liquid crystal director distribution and transmittance pattern from edge-to-edge of a pair of electrodes when applying the in-plane electric field. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 57 (1990), S. 1120-1122 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Epitaxial layers of GaAs with peak mobilities as high as 200 000 cm2/V s at 50 K have been grown in an atmospheric pressure organometallic vapor phase epitaxy reactor using trimethylgallium (TMG) and arsine. The growth conditions which lead to high-mobility GaAs are described in this letter. Low-temperature photoluminescence and temperature-dependent Hall measurements are used to study the dependence of the incorporation of residual impurities on the growth temperature and arsine partial pressure. Carbon acceptor densities 〈1014 cm−3 were measured in the highest purity samples.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 81 (2002), S. 13-15 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Femtosecond pulse shaping and photomixing methods are combined to make a tunable terahertz source. Grating-pair pulse shaper selects two main frequency components to produce pulses that are modulated with a period which is inversely proportional to the frequency separation. The shaped pulse is then photomixed in semi-insulating GaAs under external bias. Terahertz (THz) emission frequency follows the modulation frequency of the excitation pulses, from 0.5 to 3 THz. Contrary to cw photomixing, this method can easily be combined with electro-optic and photoconductive sampling detection methods. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 79 (2001), S. 1130-1132 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have measured both spectrum- and time-resolved photoluminescence (PL) of InGaN/GaN light-emitting diode structure as a function of an external bias. From spectrum-resolved PL, we observed regions of blueshift and redshift in peak PL energies. From the bias point at which redshift begins, which we attribute to the inversion of electric field due to full compensation of the piezoelectric field (PEF), we estimate PEF to be 2.1±0.2 MV/cm. From time-resolved PL, we found the carrier lifetimes to drastically decrease (2.5 ns–2 ps) with increasing reverse bias. We attribute this decrease to escape tunneling through tilted barriers. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 69 (1996), S. 623-625 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A response mechanism of nematic liquid crystals following the switching-on and off of an in-plane electric field when using the in-plane switching (IPS) mode was investigated. Simplified theoretical expressions, which were derived with an assumption that an in-plane electric field was applied to the liquid crystals, were used to explain the dynamical switching process in the IPS mode. In particular, the relaxation time of the liquid crystals when removing the electric field was described as a proportional relationship to the square of the cell gap. A thinner cell gap also proved to be effective in obtaining a fast response time in the IPS mode. By contrast, the switching-on time when applying the in-plane electric field proved to be inversely proportional to the difference between the square of the electric field strength and the square of the critical electric field strength at which the liquid crystals begin to deform. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 67 (1995), S. 3895-3897 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Electro-optical characteristics related to the threshold behavior of liquid crystals when using the in-plane switching (IPS) mode were investigated with interdigital electrodes. In order to analyze the switching behavior of liquid crystals, an equation, which expresses the threshold transition, was derived using the continuum elastic theory. It was made clear that it was the electric field and not the voltage that drives the liquid crystals in the IPS mode. Significantly, an inversely proportional relationship between the threshold voltage and the gap between the substrates was found to hold. Furthermore, the electro-optical characteristics were recognized to change with the variation of the gap between the substrates. This behavior is due to the independence of electric field on liquid crystal layer normal. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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